Bruker S1 Turbo SD-LE XRF Spectrometer

Original price was: $9.200.Current price is: $7.900.

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Bruker S1 Turbo SD-LE XRF Spectrometer benefits at a glance:
– Supports many calibrations and applications
– The first ever SDD-based handheld analyzer
– Superior count rates and resolution (compared to previous generation SiPIN instruments)
– PPM detection limits
– Rapid and accurate analysis on materials such as lead (Pb), mercury (Hg), chrome (Cr), cadmium (Cd), and bromine (Br) at part per million levels

The S1 TURBOSDR is designed for the analysis of restricted materials. The calibration is specifically directed to the analysis of heavy metals in all types of samples. The SDD detector provides rapid analysis and low detection limits for such analysis.

The S1 TURBOSDR uses X-ray Fluorescence (XRF) for a quick and completely non-destructive method of restricted materials testing for applications such as lead free manufacturing RoHS compliance and the detection of heavy metals in toys (ASTM F-963), children’s products (CPSIA) and consumer products. The S1 TURBOSDR provides rapid and accurate analysis on materials such as lead (Pb), mercury (Hg), chrome (Cr), cadmium (Cd), and bromine (Br) at part per million levels.

Bruker S1 Turbo SD-LE XRF Spectrometer Physical Parameters

Dimensions11.8 x 3.9 x 11 in (300 x 100 x 280 mm)Weight
Weight<5 Lbs.; 4.49 Lbs. (2 kg) with batteries 3.9 Lbs. (1.77 kg) without batteries
Power RequirementsLithium Battery; AC/DC Line Power; Li-ion (6 hr. operating time) AC Adapter: Optional
Noise ProducedNegligible

 

Logistical Parameters

TransportabilityHandheld
RuggednessNone; Not militarized, drop sensitive
Operating Conditions–10 to 50°C (14 to 122°F)
ConsumablesNone
Solvents/ReagentsNone
Calibration ScheduleFactory calibrated with 31 or 36 elements
Communications InterfaceActiveSync via USB or wireless Bluetooth Memory Card
Shelf Life>5 years

 

Operational Parameters

Other Chemical TargetsElemental analysis
AdaptabilityNo; cannot detect or add new targets
Sample IntroductionSolid
Start Up Time (From Cold Start To Sample Ready)15 minutes
Response Time (Sample Application To Output)<5 minutes; 2 minutes
Alarm CapabilityPass/Fail option
Software ControlYes
Other Operational Parameters10 mm2 X-Flash SDD Detector, Peltier cooled; typical resolution 145 eV @ 100,000 cps X-ray tube with Ag target

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