Bruker S1 Turbo SD-LE XRF Spectrometer benefits at a glance:
– Supports many calibrations and applications
– The first ever SDD-based handheld analyzer
– Superior count rates and resolution (compared to previous generation SiPIN instruments)
– PPM detection limits
– Rapid and accurate analysis on materials such as lead (Pb), mercury (Hg), chrome (Cr), cadmium (Cd), and bromine (Br) at part per million levels
The S1 TURBOSDR is designed for the analysis of restricted materials. The calibration is specifically directed to the analysis of heavy metals in all types of samples. The SDD detector provides rapid analysis and low detection limits for such analysis.
The S1 TURBOSDR uses X-ray Fluorescence (XRF) for a quick and completely non-destructive method of restricted materials testing for applications such as lead free manufacturing RoHS compliance and the detection of heavy metals in toys (ASTM F-963), children’s products (CPSIA) and consumer products. The S1 TURBOSDR provides rapid and accurate analysis on materials such as lead (Pb), mercury (Hg), chrome (Cr), cadmium (Cd), and bromine (Br) at part per million levels.
Bruker S1 Turbo SD-LE XRF Spectrometer Physical Parameters
Dimensions | 11.8 x 3.9 x 11 in (300 x 100 x 280 mm)Weight |
Weight | <5 Lbs.; 4.49 Lbs. (2 kg) with batteries 3.9 Lbs. (1.77 kg) without batteries |
Power Requirements | Lithium Battery; AC/DC Line Power; Li-ion (6 hr. operating time) AC Adapter: Optional |
Noise Produced | Negligible |
Logistical Parameters
Transportability | Handheld |
Ruggedness | None; Not militarized, drop sensitive |
Operating Conditions | –10 to 50°C (14 to 122°F) |
Consumables | None |
Solvents/Reagents | None |
Calibration Schedule | Factory calibrated with 31 or 36 elements |
Communications Interface | ActiveSync via USB or wireless Bluetooth Memory Card |
Shelf Life | >5 years |
Operational Parameters
Other Chemical Targets | Elemental analysis |
Adaptability | No; cannot detect or add new targets |
Sample Introduction | Solid |
Start Up Time (From Cold Start To Sample Ready) | 15 minutes |
Response Time (Sample Application To Output) | <5 minutes; 2 minutes |
Alarm Capability | Pass/Fail option |
Software Control | Yes |
Other Operational Parameters | 10 mm2 X-Flash SDD Detector, Peltier cooled; typical resolution 145 eV @ 100,000 cps X-ray tube with Ag target |
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